Installation of 1 line with 3 channels, and measurement is possible before and after the process! Multi-point film thickness measurement.
Multi-point film thickness measurement capable of pre- and post-measurements in multiple channels. It uses multiple receiving heads to measure the film thickness values at multiple points simultaneously.
The "FF8" allows for non-contact multi-point thickness measurement by measuring the sample's reflectance (interference waveform) and analyzing the thickness values using methods such as FFT (Fast Fourier Transform thickness gauge) and curve fitting thickness gauges. In addition to thickness measurement, it can also measure the thickness and refractive index of films and glass, and with optional features, it can perform measurements and analyses for multilayer films, curve fitting methods, microscopy, mapping measurements, color measurements, and component concentration analysis. To efficiently measure and analyze differences in film thickness and variations, automatic mapping measurements can be performed using an automatic XY stage. (Mapping film measurement) 【Features】 ■ Measures the sample's reflectance and analyzes thickness values using FFT and other methods ■ Capable of measuring the thickness and refractive index of films and glass in addition to thickness measurement ■ Measurement data can be saved as files and reanalyzed later ■ Can also be used for inline thickness measurement ■ Custom specifications can be accommodated *For more details, please refer to the PDF document or feel free to contact us.
- Company：システムロード
- Price：Other
